1. Advanced formal verification
Author: / edited by Rolf Drechsler
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Electronic circuits- Testing,Decision trees
Classification :
E-BOOK
2. Advanced formal verification
Author: / edited by Rolf Drechsler
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: Electronic circuits- Testing,Decision trees
Classification :
TK7867
.
A38
2004
3. Advanced formal verification
Author: / edited by Rolf Drechsler
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Electronic circuits -- Testing,Decision trees
Classification :
TK
7867
.
A38
2004
4. Advanced formal verification
Author: / edited by Rolf Drechsler
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: Electronic circuits- Testing,Decision trees
Classification :
TK7867
.
A38
2004
5. Advances in electronic testing :
Author: edited by Dimitris Gizopoulos
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic circuits-- Testing
6. Advances in electronic testing
Author: / edited by Dimitris Gizopoulos
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Electronic circuits -- Testing
Classification :
TK
7867
.
A385
2006
7. Algorithms for synthesis and testing of asynchronous circuits
Author: Lavagno, Luciano
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Electronic digital computers - Circuits - Testing , Electronic digital computers - Circuits - Mathematical models, Asynchronous circuits - Testing, Asynchronous circuits - Mathematical models
Classification :
TK
7888
.
4
.
L38
8. Analog and mixed-signal boundary-scan
Author: / Adam Osseiran, editor
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: Printed circuits--Testing--Standards,Boundary scan testing.,Mixed signal circuits--Testing,Electronic digital computers--Circuits--Design and construction,Boundary scan testing.,Mixed signal circuits--Testing,Printed circuits--Testing--Standards,Electronic digital computers--Circuits--Design and construction
Classification :
TK
,
7868
,.
P7
,
A53
,
1999
9. Analog and mixed-signal boundary-scan :
Author: / edited by Adam Osseiran
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Printed circuits , Testing , Standards,Boundary scan testing,Mixed signal circuits , Testing,Electronic digital computers , Circuits , Design and construction
Classification :
E-BOOK
10. Analog test signal generation using periodic [sigma delta]-encoded data streams
Author: / by Benoit Dufort and Gordon W. Roberts
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Signal generators,Electronic circuits , Testing,Integrated circuits , Testing,Coding theory,Signal processing , Digital techniques,Analog-to-digital converters
Classification :
E-BOOK
11. Applied formal verification
Author: / Douglas L. Perry, Harry D. Foster
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits -- Verification,Electronic circuits -- Testing
Classification :
TK
7874
.
58
.
P47
2005
12. Complete guide to electronic test equipment and troubles hooting techniques
Author: John Douglas- Young
Library: Central Library and Document Center of Shahid Madani University of Azarbayjan (East Azarbaijan)
Subject: Electronic circuits - Testing - Equipment and supplies
Classification :
TK
,
7867
,.
D6
,
1989
13. Demystifying mixed-signal test methods /
Author: Mark Baker.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Automatic test equipment.,Electronic apparatus and appliances-- Testing.,Mixed signal circuits.,Signal generators.,Automatic test equipment.,Electronic apparatus and appliances-- Testing.,Mixed signal circuits.,Signal generators.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- General.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- Integrated.
Classification :
TK7895
.
A8
B34
2003eb
14. Designing, testing, and diagnostics- join them
Author: International Test conference )3991: Baltimore, Md.(
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Integrated circuits- Testing- congresses,، Electronic digital computers- Circuits- Testing-Congresses
Classification :
TK
7874
.
I474
1993
15. Digital hardware testing. transistor-level fault modeling and testing
Author: Rajsuman, Rochit., Rochit Rajsuman
Library: Library and Documentation Center of Kurdistan University (Kurdistan)
Subject: ، Electronic digital computers- Circuits- Testing- Data processing,، Integrated circuits- Very large scale integration- Testing- Data processing,، Electric fault location
Classification :
TK
7888
.
4
.
R35
16. Electronic fault diagnosis
Author: George Loveday
Library: Central Library Yasuj University (Kohgiluye va Buyer ahmad)
Subject: Electronic apparatus and appliances- Maintenance and repair,Electronic apparatus and appliances- Testing,Electronic circuits- Testing,Electric fault location
Classification :
621
,.
381028
,
L89
,
1977
17. Electronic fault diagnosis
پدیدآورنده : Loveday, Geroge
موضوع : ، Electronic apparatus and appliances-- Maintenance and repair,، Electronic apparatus and appliances-- Testing,، Electronic circuits-- Testing
۳ نسخه از این کتاب در ۲ کتابخانه موجود است.
18. Electronic fault diagnosis
Author: LOVEDAY,GEORGE
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: ELECTRONIC APPARATUS & APPLIANCES , ELECTRONIC CIRCUITS-TESTING
Classification :
TK
7870
.
L65
1988
19. Electronic testing and fault diagnosis
Author: / G. C. Loveday
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Electronic equipment,Circuits testing
Classification :
TK
7878
.
4
.
L6
20. Electronic testing and fault diagnosis
Author:
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: Electronic apparatus and appliances Testing.,Electronic equipment Circuits Testing
Classification :
TK7870
.
L65
1991
